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ELT-HIRES the high resolution spectrograph for the ELT: application of E2E + ETC for instrument characterisation, from efficiency to accuracy in radial velocity measurements
Author(s): M. Genoni; M. Landoni; P. Huke; N. Sanna; E. Mason; A. Marconi; L. Origlia; M. Riva; P. Di Marcantonio
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Paper Abstract

We present an application of the HIRES End-to-End (E2E) simulator and HIRES Exposure Time Calculator (ETC) to derive a more detailed behavior of the spectrograph efficiency by including physical modeling of diffraction at the echelle grating and the cross-disperser. The result will be used with the Spectral Energy Distributions of calibration lights for wavelength solutions and flat fielding to quantitatively characterize the spectrograph in terms of achieved accuracy. By showing the contribution of photon noise, detector noise and cross talk between adjacent fibers we discuss methods that could be used to determine the overall performance of the instrument, in term of the capability of photon collection as well as especially on the achieved precision on wavelength calibration that translates directly in radial velocity accuracy of the scientific light.

Paper Details

Date Published: 12 July 2018
PDF: 9 pages
Proc. SPIE 10702, Ground-based and Airborne Instrumentation for Astronomy VII, 107029I (12 July 2018); doi: 10.1117/12.2313360
Show Author Affiliations
M. Genoni, INAF - Osservatorio Astronomico di Brera (Italy)
M. Landoni, INAF - Osservatorio Astronomico di Brera (Italy)
P. Huke, Georg-August-Univ. Göttingen (Germany)
N. Sanna, INAF - Osservatorio Astrofisico di Arcetri (Italy)
E. Mason, INAF - Osservatorio Astronomico di Trieste (Italy)
A. Marconi, INAF - Osservatorio Astronomico di Arcetri (Italy)
L. Origlia, INAF - Osservatorio Astronomico di Bologna (Italy)
M. Riva, INAF - Osservatorio Astronomico di Brera (Italy)
P. Di Marcantonio, INAF - Osservatorio Astronomico di Trieste (Italy)

Published in SPIE Proceedings Vol. 10702:
Ground-based and Airborne Instrumentation for Astronomy VII
Christopher J. Evans; Luc Simard; Hideki Takami, Editor(s)

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