Share Email Print
cover

Proceedings Paper • new

Proximity effect model for x-ray transition edge sensors
Author(s): R. C. Harwin; D. J. Goldie; S. Withington; P. Khosropanah; L. Gottardi; J.-R. Gao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Transition Edge Sensors are ultra-sensitive superconducting detectors with applications in many areas of research, including astrophysics. The device consists of a superconducting thin film, often with additional normal metal features, held close to its transition temperature and connected to two superconducting leads of a higher transition temperature. There is currently no way to reliably assess the performance of a particular device geometry or material composition without making and testing the device. We have developed a proximity effect model based on the Usadel equations to predict the effects of device geometry and material composition on sensor performance. The model is successful in reproducing I −V curves for two devices currently under study. We use the model to suggest the optimal size and geometry for TESs, considering how small the devices can be made before their performance is compromised. In the future, device modelling prior to manufacture will reduce the need for time-consuming and expensive testing.

Paper Details

Date Published: 6 July 2018
PDF: 12 pages
Proc. SPIE 10709, High Energy, Optical, and Infrared Detectors for Astronomy VIII, 107091C (6 July 2018); doi: 10.1117/12.2313359
Show Author Affiliations
R. C. Harwin, Cavendish Lab. (United Kingdom)
D. J. Goldie, Cavendish Lab. (United Kingdom)
S. Withington, Cavendish Lab. (United Kingdom)
P. Khosropanah, SRON National Institute for Space Research (Netherlands)
L. Gottardi, SRON National Institute for Space Research (Netherlands)
J.-R. Gao, SRON National Institute for Space Research (Netherlands)
Kavli Institute of NanoScience, Delft Univ. of Technology (Netherlands)


Published in SPIE Proceedings Vol. 10709:
High Energy, Optical, and Infrared Detectors for Astronomy VIII
Andrew D. Holland; James Beletic, Editor(s)

© SPIE. Terms of Use
Back to Top