Share Email Print
cover

Proceedings Paper • new

Spectroscopy on chip: a new design for semiconductor bolometers to include spectroscopy within the pixels (Conference Presentation)
Author(s): Sophie Bounissou; Louis Rodriguez; Vincent Revéret; Albrecht Poglitsch
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Since the development of the instrument PACS on the HERSCHEL space observatory, the silicon bolometers technology is well understood and handled at CEA. Our pixels are based on a well-known concept of electromagnetism: the absorber closes a quarter-wave cavity which allows to get maximal absorption at the corresponding wavelength. In the frame of the SPICA mission and more precisely for the SAFARI-pol instrument, we have designed and manufactured new absorbers with a different pattern that enables detectors to be sensitive to the polarization. In this way, the measurement of the polarized (sub)millimeter radiation is directly performed within the pixel. Similarly, we want to introduce a spectroscopic capacity inside the chip. In this talk, we will present the interferometric system that has been designed to fulfill the spectroscopic requirements of a space mission. The physics on which rely the interferences of multiple waves inside the detector will be largely developed. In the last part, we will describe the inverse process that follows the data acquisition, and will be carried out from the spectrometer chip characterization. The final aim of this research is to pave the way to bolometer focal planes with polarimetry and spectroscopy capabilities inside the detectors.  

Paper Details

Date Published: 10 July 2018
PDF
Proc. SPIE 10708, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX, 107081Q (10 July 2018); doi: 10.1117/12.2312543
Show Author Affiliations
Sophie Bounissou, CEA-Ctr. de SACLAY (France)
Louis Rodriguez, CEA-Ctr. de SACLAY (France)
Vincent Revéret, CEA-Ctr. de SACLAY (France)
Albrecht Poglitsch, CEA-Ctr. de SACLAY (France)


Published in SPIE Proceedings Vol. 10708:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX
Jonas Zmuidzinas; Jian-Rong Gao, Editor(s)

© SPIE. Terms of Use
Back to Top