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Proceedings Paper • new

The finite element analysis modeling of micro pore optic plate
Author(s): Xue Yang; Chen Zhang; Zhixing Ling; Ge Jin; Longhui Li; Weimin Yuan; Shuangnan Zhang
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Paper Abstract

The X-ray imaging with Micro-Pore Optic (MPO) plates can provide huge field of view with light mass, which will be applied for the Wide-field X-ray telescope (WXT), one of the two payloads onboard China’s Einstein Probe (EP) mission. Since each MPO plate has millions of micro square pores with width of 20 μm which actually behave as honeycomb materials, the mechanical properties of the MPO plates will be much more complex than normal optical glass as homogeneous material. This work estimated the mechanical properties of MPO plates, provided an equivalent mechanical properties as homogeneous material to greatly simplify the Finite-Element Analysis (FEA). Three basic material properties of MPO plates - relative density, effective elastic stiffness (Young’s module) and the effective Poisson’s ratio are estimated and preliminary validated with FEA simulations.

Paper Details

Date Published: 6 July 2018
PDF: 7 pages
Proc. SPIE 10699, Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray, 106993Z (6 July 2018); doi: 10.1117/12.2312382
Show Author Affiliations
Xue Yang, National Astronomical Observatories (China)
Univ. of Chinese Academy of Sciences (China)
Chen Zhang, National Astronomical Observatories (China)
Univ. of Chinese Academy of Sciences (China)
Zhixing Ling, National Astronomical Observatories (China)
Univ. of Chinese Academy of Sciences (China)
Ge Jin, North Night Vision Technology Co., Ltd. (China)
Longhui Li, North Night Vision Technology Co., Ltd. (China)
Weimin Yuan, National Astronomical Observatories (China)
Univ. of Chinese Academy of Sciences (China)
Shuangnan Zhang, National Astronomical Observatories (China)
Institute of High Energy Physics (China)


Published in SPIE Proceedings Vol. 10699:
Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray
Jan-Willem A. den Herder; Shouleh Nikzad; Kazuhiro Nakazawa, Editor(s)

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