Share Email Print
cover

Proceedings Paper • new

Characterization of the reflectivity of various white materials
Author(s): Luke M. Schmidt; Madelynn Gomez; Doyeon Kim; Michael Torregosa; Marcus Sauseda; Travis Prochaska; D. L. DePoy; J. L. Marshall; Lawrence Gardner; Walter Grant
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present total reflectance measurements and Lambertian characterization of various materials that are commonly (and uncommonly) used as a screen for imaging system calibration (such as flat fielding). We measure the total reflectance of the samples over a broad wavelength range (250 nm < λ < 2500 nm) that is of interest to astronomical instruments in the ultraviolet, visible, and near-infrared regimes. A Helium-Neon laser was used to determine how closely the various materials' diffuse reflectance characteristics match that of a Lambertian surface.

Paper Details

Date Published: 10 July 2018
PDF: 8 pages
Proc. SPIE 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III, 107065F (10 July 2018); doi: 10.1117/12.2312365
Show Author Affiliations
Luke M. Schmidt, Texas A&M Univ. (United States)
Madelynn Gomez, Texas A&M Univ. (United States)
Doyeon Kim, Texas A&M Univ. (United States)
Michael Torregosa, Texas A&M Univ. (United States)
Marcus Sauseda, Texas A&M Univ. (United States)
Travis Prochaska, Texas A&M Univ. (United States)
D. L. DePoy, Texas A&M Univ. (United States)
J. L. Marshall, Texas A&M Univ. (United States)
Lawrence Gardner, Texas A&M Univ. (United States)
Rutgers Univ. (United States)
Walter Grant, Texas A&M Univ. (United States)


Published in SPIE Proceedings Vol. 10706:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III
Ramón Navarro; Roland Geyl, Editor(s)

© SPIE. Terms of Use
Back to Top