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Characterization of the reflectivity of various white materials
Author(s): Luke M. Schmidt; Madelynn Gomez; Doyeon Kim; Michael Torregosa; Marcus Sauseda; Travis Prochaska; D. L. DePoy; J. L. Marshall; Lawrence Gardner; Walter Grant
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Paper Abstract

We present total reflectance measurements and Lambertian characterization of various materials that are commonly (and uncommonly) used as a screen for imaging system calibration (such as flat fielding). We measure the total reflectance of the samples over a broad wavelength range (250 nm < λ < 2500 nm) that is of interest to astronomical instruments in the ultraviolet, visible, and near-infrared regimes. A Helium-Neon laser was used to determine how closely the various materials' diffuse reflectance characteristics match that of a Lambertian surface.

Paper Details

Date Published: 10 July 2018
PDF: 8 pages
Proc. SPIE 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III, 107065F (10 July 2018); doi: 10.1117/12.2312365
Show Author Affiliations
Luke M. Schmidt, Texas A&M Univ. (United States)
Madelynn Gomez, Texas A&M Univ. (United States)
Doyeon Kim, Texas A&M Univ. (United States)
Michael Torregosa, Texas A&M Univ. (United States)
Marcus Sauseda, Texas A&M Univ. (United States)
Travis Prochaska, Texas A&M Univ. (United States)
D. L. DePoy, Texas A&M Univ. (United States)
J. L. Marshall, Texas A&M Univ. (United States)
Lawrence Gardner, Texas A&M Univ. (United States)
Rutgers Univ. (United States)
Walter Grant, Texas A&M Univ. (United States)

Published in SPIE Proceedings Vol. 10706:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III
Ramón Navarro; Roland Geyl, Editor(s)

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