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Proceedings Paper

Characterization of the reflectivity of various black materials II
Author(s): Luke M. Schmidt; Madelynn Gomez; Doyeon Kim; Michael Torregosa; Marcus Sauseda; Travis Prochaska; D. L. DePoy; J. L. Marshall; Lawrence Gardner; Walter Grant
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Paper Abstract

We report on an expanded catalog of total and specular reflectance measurements of various common (and uncommon) materials used in the construction and/or baffling of optical systems. Total reflectance is measured over a broad wavelength range (250 nm < λ < 2500 nm) that is applicable to ultraviolet, visible, and near-infrared instrumentation. Characterization of each sample's specular reflection was measured using a helium-neon laser in two degree steps from near normal to grazing angles of incidence. The total and specular reflection measurements were then used to derive the specular fraction of each material.

Paper Details

Date Published: 10 July 2018
PDF: 8 pages
Proc. SPIE 10706, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III, 107065E (10 July 2018); doi: 10.1117/12.2312359
Show Author Affiliations
Luke M. Schmidt, Texas A&M Univ. (United States)
Madelynn Gomez, Texas A&M Univ. (United States)
Doyeon Kim, Texas A&M Univ. (United States)
Michael Torregosa, Texas A&M Univ. (United States)
Marcus Sauseda, Texas A&M Univ. (United States)
Travis Prochaska, Texas A&M Univ. (United States)
D. L. DePoy, Texas A&M Univ. (United States)
J. L. Marshall, Texas A&M Univ. (United States)
Lawrence Gardner, Texas A&M Univ. (United States)
Rutgers Univ. (United States)
Walter Grant, Texas A&M Univ. (United States)

Published in SPIE Proceedings Vol. 10706:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III
Ramón Navarro; Roland Geyl, Editor(s)

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