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Prospects for wireless optical intensity interferometry with the Southern Connecticut stellar interferometer
Author(s): Elliott P. Horch; Samuel A. Weiss; Justin D. Rupert; Ryan LaRue; Pietro Peronio; Ivan Rech; Angelo Gulinatti
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Paper Abstract

The Southern Connecticut Stellar Interferometer (SCSI) is a two-telescope astronomical intensity interferometer that was completed in June 2016 and has been taking photon correlation data since that time. It uses single-photon avalanche diode (SPAD) detectors at the telescope focal plane and a central timing module, which records the signals from both telescopes simultaneously. In the observations taken to date, single-pixel SPADs have been connected to signal cables that stretch from each telescope to the timing module. However, we are now in the process of making the instrument “wireless” by using a separate timing module at each telescope and synchronizing the signals recorded using GPS timing cards. We have also upgraded one of the two stations with an 8-pixel SPAD device, which allows us to achieve higher count rates in a variety of observing conditions. In this paper, we report on the current state of the instrument, including engineering tests made in preparation for wireless operation, and we discuss the expected capabilities in that mode.

Paper Details

Date Published: 9 July 2018
PDF: 8 pages
Proc. SPIE 10701, Optical and Infrared Interferometry and Imaging VI, 107010Y (9 July 2018); doi: 10.1117/12.2311797
Show Author Affiliations
Elliott P. Horch, Southern Connecticut State Univ. (United States)
Lowell Observatory (United States)
Samuel A. Weiss, Southern Connecticut State Univ. (United States)
Justin D. Rupert, Southern Connecticut State Univ. (United States)
Ryan LaRue, Southern Connecticut State Univ. (United States)
Pietro Peronio, Politecnico di Milano (Italy)
Ivan Rech, Politecnico di Milano (Italy)
Angelo Gulinatti, Politecnico di Milano (Italy)


Published in SPIE Proceedings Vol. 10701:
Optical and Infrared Interferometry and Imaging VI
Michelle J. Creech-Eakman; Peter G. Tuthill; Antoine Mérand, Editor(s)

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