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Performance modeling of terahertz (THz) and millimeter waves (mmW) pupil plane imaging
Author(s): Nafiseh Mohammadian; Orges Furxhi; Lei Zhang; Peter Offermans; Galia Ghazi; Ronald Driggers
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Paper Abstract

Terahertz- (THz) and millimeter-wave sensors are becoming more important in industrial, security, medical, and defense applications. A major problem in these sensing areas is the resolution, sensitivity, and visual acuity of the imaging systems. There are different fundamental parameters in designing a system that have significant effects on the imaging performance. The performance of THz systems can be discussed in terms of two characteristics: sensitivity and spatial resolution. New approaches for design and manufacturing of THz imagers are a vital basis for developing future applications. Photonics solutions have been at the technological forefront in THz band applications. A single scan antenna does not provide reasonable resolution, sensitivity, and speed. An effective approach to imaging is placing a high-performance antenna in a two-dimensional antenna array to achieve higher radiation efficiency and higher resolution in the imaging systems. Here, we present the performance modeling of a pupil plane imaging system to find the resolution and sensitivity efficiency of the imaging system.

Paper Details

Date Published: 14 May 2018
PDF: 14 pages
Proc. SPIE 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX, 1062511 (14 May 2018); doi: 10.1117/12.2311496
Show Author Affiliations
Nafiseh Mohammadian, IMEC (United States)
CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Orges Furxhi, IMEC (United States)
Lei Zhang, IMEC (United States)
Peter Offermans, IMEC (United States)
Galia Ghazi, IMEC (United States)
Ronald Driggers, IMEC (United States)
CREOL, College of Optics and Photonics, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 10625:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
Gerald C. Holst; Keith A. Krapels, Editor(s)

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