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Proceedings Paper

Effect of visibility of the fringes on the tilt measurement using a cyclic interferometer and polarization phase shifting
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Paper Abstract

Precise measurement of extremely small tilt angles is of immense importance in various scientific and technological applications. Interferometry has always been a tool of great importance in such applications. Most of the conventional interferometric techniques use a Michelson configuration and the problem with this interferometer is that it is extremely sensitive to environmental turbulances and vibrations. In our privious works, we had introduced a cyclic interferometer for the measurement of tilt angles which showed excellent stability against environmental turbulances and vibrations as well as twice the sensitivity. Also, with the introduction of multiple reflections, sensitivity as low as 5 micro radian had been achieved by us. To improve the sensitivity further, we had employed phase shifting techniques. The cyclic configuration being a same path interferometer, we used a polarizing phase shifting technique. For acieving this, we developed a new scheme of polarizing phase shifting techique which is rather simpler compared to those reported in the literature. With this we could precisely measure angles as low as 2 nano radians. However, in these measurements we found that the precise alignment of the quarter wave plate plays an important role in the visibility of the fringes which affects the accuracy of measurement. In this work, we numerically investigate the effect of the misalignment of the quarter wave plate on the visibility of the fringes and consequently on the accurcy of the measurement.

Paper Details

Date Published: 15 June 2018
PDF: 8 pages
Proc. SPIE 10692, Optical Fabrication, Testing, and Metrology VI, 106921F (15 June 2018); doi: 10.1117/12.2311303
Show Author Affiliations
V. C. Pretheesh Kumar, Indian Institute of Technology Madras (India)
C. Joenathan, Rose-Hulman Institute of Technology (United States)
A. Bernal, Rose-Hulman Institute of Technology (United States)
A. R. Ganesan, Indian Institute of Technology Madras (India)


Published in SPIE Proceedings Vol. 10692:
Optical Fabrication, Testing, and Metrology VI
Sven Schröder; Roland Geyl, Editor(s)

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