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Proceedings Paper

Determination of the nonlinear refraction through the measurement of light wavefront distortions
Author(s): Aristides Marcano Olaizola; Herve Maillotte; D. Gindre; D. Metin
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Paper Abstract

A method for the measurement of the nonlinear refraction and absorption in optical materials studying the distortions of the wavefront of light beams is proposed. Using a one-shot CCD camera, the beam profile changes are recorded for different cell positions. Usual Z-scan, eclipse Z-scan and the total profile distortion signals can be extracted from these data. Proportionality between the measured total signal and the induced phase shift is demonstrated. A comparison between this signal and the usual Z-scan signal is performed.

Paper Details

Date Published: 5 February 1996
PDF: 4 pages
Proc. SPIE 2730, Second Iberoamerican Meeting on Optics, (5 February 1996); doi: 10.1117/12.231107
Show Author Affiliations
Aristides Marcano Olaizola, Instituto Venezolano de Investigaciones Cientificas (Venezuela)
Herve Maillotte, Univ. de Franche-Comte (France)
D. Gindre, Univ. de Franche-Comte (France)
D. Metin, Univ. de Franche-Comte (France)


Published in SPIE Proceedings Vol. 2730:
Second Iberoamerican Meeting on Optics
Daniel Malacara-Hernandez; Sofia E. Acosta-Ortiz; Ramon Rodriguez-Vera; Zacarias Malacara; Arquimedes A. Morales, Editor(s)

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