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Proceedings Paper

C3TM: CEI CCD charge transfer model for radiation damage analysis and testing
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Paper Abstract

Radiation induced defects in the silicon lattice of Charge Couple Devices (CCDs) are able to trap electrons during read out and thus create a smearing effect that is detrimental to the scientific data. To further our understanding of the positions and properties of individual radiation-induced traps and how they affect space- borne CCD performance, we have created the Centre for Electronic Imaging (CEI) CCD Charge Transfer Model (C3TM). This model simulates the physical processes taking place when transferring signal through a radiation damaged CCD. C3TM is a Monte Carlo model based on Shockley-Read-Hall theory, and it mimics the physical properties in the CCD as closely as possible. It runs on a sub-electrode level taking device specific charge density simulations made with professional TCAD software as direct input. Each trap can be specified with 3D positional information, emission time constant and other physical properties. The model is therefore also able to simulate multi-level clocking and other complex clocking schemes, such as trap pumping.

Paper Details

Date Published: 20 July 2018
PDF: 13 pages
Proc. SPIE 10709, High Energy, Optical, and Infrared Detectors for Astronomy VIII, 1070918 (20 July 2018); doi: 10.1117/12.2309944
Show Author Affiliations
Jesper Skottfelt, e2v Ctr. for Electronic Imaging, The Open Univ. (United Kingdom)
David J. Hall, e2v Ctr. for Electronic Imaging, The Open Univ. (United Kingdom)
Ben Dryer, e2v Ctr. for Electronic Imaging, The Open Univ. (United Kingdom)
Ross Burgon, e2v Ctr. for Electronic Imaging, The Open Univ. (United Kingdom)
Andrew Holland, e2v Ctr. for Electronic Imaging, The Open Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 10709:
High Energy, Optical, and Infrared Detectors for Astronomy VIII
Andrew D. Holland; James Beletic, Editor(s)

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