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Proceedings Paper • Open Access

Ultra compact spectrometer using linear variable filters

Paper Abstract

The Linearly Variable Filters (LVF) are complex optical devices that, integrated in a CCD, can realize a "single chip spectrometer". In the framework of an ESA Study, a team of industries and institutes led by SELEX-Galileo explored the design principles and manufacturing techniques, realizing and characterizing LVF samples based both on All-Dielectric (AD) and Metal-Dielectric (MD) Coating Structures in the VNIR and SWIR spectral ranges. In particular the achieved performances on spectral gradient, transmission bandwidth and Spectral Attenuation (SA) are presented and critically discussed. Potential improvements will be highlighted. In addition the results of a feasibility study of a SWIR Linear Variable Filter are presented with the comparison of design prediction and measured performances. Finally criticalities related to the filter-CCD packaging are discussed.

The main achievements reached during these activities have been:
- to evaluate by design, manufacturing and test of LVF samples the achievable performances compared with target requirements;
- to evaluate the reliability of the projects by analyzing their repeatability;
- to define suitable measurement methodologies

Paper Details

Date Published: 11 January 2018
PDF: 7 pages
Proc. SPIE 10565, International Conference on Space Optics — ICSO 2010, 1056559 (11 January 2018); doi: 10.1117/12.2309265
Show Author Affiliations
M. Dami, SELEX-Galileo S.p.A. (Italy)
R. De Vidi, SELEX-Galileo S.p.A. (Italy)
G. Aroldi, SELEX-Galileo S.p.A. (Italy)
F. Belli, SELEX-Galileo S.p.A. (Italy)
L. Chicarella, SELEX-Galileo S.p.A. (Italy)
A. Piegari, ENEA (Italy)
A. Sytchkova, ENEA (Italy)
J. Bulir, ENEA (Italy)
F. Lemarquis, Institut Fresnel (France)
M. Lequime, Institut Fresnel (France)
L. Abel Tibérini, Institut Fresnel (France)
B. Harnisch, ESA-ESTEC (Netherlands)


Published in SPIE Proceedings Vol. 10565:
International Conference on Space Optics — ICSO 2010
Errico Armandillo; Bruno Cugny; Nikos Karafolas, Editor(s)

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