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Proceedings Paper

Raman study of thermally crystallized amorphous silicon
Author(s): P. Danesh
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Paper Abstract

The method for direct measurement of refractive index profile of gradient-index planar optical waveguides, in particular of glass waveguides made by thermal ion-exchange, is based on the step-by-step etching technique. The refractive index of the waveguide surface is determined from the measured intensity of the reflected beams using two immersion media.

Paper Details

Date Published: 23 July 1993
PDF: 2 pages
Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983CD (23 July 1993); doi: 10.1117/12.2308864
Show Author Affiliations
P. Danesh, Institute of Solid State Physics (Bulgaria)


Published in SPIE Proceedings Vol. 1983:
16th Congress of the International Commission for Optics: Optics as a Key to High Technology
Gyorgy Akos; Tivadar Lippenyi; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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