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Proceedings Paper

Optical nondestructive inspection as a part of modern high technologies
Author(s): V. S. Rondarev
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Paper Abstract

Raman scattering was employed to study the thermal crystallization of plasma deposited a-Si:H. The crystalliza- tion, experiments were carried out at 850 °C for different times. It was established that at the used temperature the crystallization proceeded in the first few minutes. The amount and size of microcrystallites did not change with the prolonged annealing.

Paper Details

Date Published: 23 July 1993
PDF: 2 pages
Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983CC (23 July 1993); doi: 10.1117/12.2308863
Show Author Affiliations
V. S. Rondarev, PetroOptic, Inc. (Russian Federation)


Published in SPIE Proceedings Vol. 1983:
16th Congress of the International Commission for Optics: Optics as a Key to High Technology
Gyorgy Akos; Tivadar Lippenyi; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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