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Proceedings Paper

Application of the diffraction pattern's deformations for the measuring devices
Author(s): Alexander A. Arefiev
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Paper Abstract

Michelson visibility is used to identify areas of correct focusing in stacks of images with progressive severe defocusing. It is found that visibility is a maximum when focusing is correct. An image with partially corrected defocusing is constructed using this criterion.

Paper Details

Date Published: 23 July 1993
PDF: 2 pages
Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983BO (23 July 1993); doi: 10.1117/12.2308839
Show Author Affiliations
Alexander A. Arefiev, Moscow Institute of Geodesy, Aerial Surveying and Cartography (Russian Federation)


Published in SPIE Proceedings Vol. 1983:
16th Congress of the International Commission for Optics: Optics as a Key to High Technology
Gyorgy Akos; Tivadar Lippenyi; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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