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Proceedings Paper

Phase-conjugate interferometers for testing optical surface
Author(s): G. Notni
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Paper Abstract

A new method of detection and characterisation of microdefects on smooth optical surfaces is introduced. The method is based on a spatially resolved histogram analysis of pictures taken with a Differential Interference Contrast microscope (DIC).

Paper Details

Date Published: 23 July 1993
PDF: 2 pages
Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983AM (23 July 1993); doi: 10.1117/12.2308801
Show Author Affiliations
G. Notni, Fraunhofer Institute of Applied Optics and Precision Mechanics (Germany)


Published in SPIE Proceedings Vol. 1983:
16th Congress of the International Commission for Optics: Optics as a Key to High Technology
Gyorgy Akos; Tivadar Lippenyi; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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