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Proceedings Paper

Digital visibility measurements by fourier analysis
Author(s): Juan Pomarico
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Paper Abstract

A phase-measuring Fizeau interference microscopy with a visible laser-diode (LD) source has been studied that is based on a phase-shifting method using the wavelengths varied stepwise by changing the current in LD. The influence of Fizeau fringes with multiple-beam interference on phase-extraction algorithms has been theoretically and numerically investigated. The phase error can be minimized, when two sets of measurements corresponding to initial phase difference of n/4 are averaged. Experimental results are presented.

Paper Details

Date Published: 23 July 1993
PDF: 2 pages
Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198382 (23 July 1993); doi: 10.1117/12.2308709
Show Author Affiliations
Juan Pomarico, Ctr. de Investigaciones Opticas (Argentina)


Published in SPIE Proceedings Vol. 1983:
16th Congress of the International Commission for Optics: Optics as a Key to High Technology
Gyorgy Akos; Tivadar Lippenyi; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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