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Proceedings Paper

Ultra-wideband optical heterodyne interferometer
Author(s): Shuko Yokoyama
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Paper Abstract

The dispersion relation n=n( a) (n stands for the refractive index and a stands for the wavenumber ) of a transparent sample is measured in real time through the spectral analysis of a white light interference pattern which is obtained in a Michelson interferometer when a wide, continuous spectrum light source is used. This technique (SRWLI) was recently used for high precision refractometry 1 ,

Paper Details

Date Published: 23 July 1993
PDF: 2 pages
Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19837W (23 July 1993); doi: 10.1117/12.2308703
Show Author Affiliations
Shuko Yokoyama, IDEC Izumi Co. (Japan)


Published in SPIE Proceedings Vol. 1983:
16th Congress of the International Commission for Optics: Optics as a Key to High Technology
Gyorgy Akos; Tivadar Lippenyi; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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