Share Email Print
cover

Proceedings Paper

Exact solutions for focusing of 2D electromagnetic waves
Author(s): Jakob J. Stamnes
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Threshold criteria for the determination of width, thickness and shape of dielectric line structures with wedge shaped edges, negligible attenuation and small refractive index n (n = 1.02, tan 5 = 0.0004) are examined in the electromagnetic nearfield (distance ::: 0.L). It is demonstrated that height and position of extreme values in the polarization dependent amplitude and phase distributions are particularly suited as thresholds.

Paper Details

Date Published: 23 July 1993
PDF: 2 pages
Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198379 (23 July 1993); doi: 10.1117/12.2308680
Show Author Affiliations
Jakob J. Stamnes, Univ. Bergen (Norway)


Published in SPIE Proceedings Vol. 1983:
16th Congress of the International Commission for Optics: Optics as a Key to High Technology
Gyorgy Akos; Tivadar Lippenyi; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

© SPIE. Terms of Use
Back to Top