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Proceedings Paper

Effect of random rough interfaces in a multilayer stack
Author(s): R. Garcia Llamas
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Paper Abstract

The sum of several periodic functions is used as an approach to simulate random interfaces in multilayers where a metal is coated with a dielectric thin-film or viceversa. Experimental deviations from reflectivity of such systems respect to those with smooth interfaces are well explained with the Rayleigh theory.

Paper Details

Date Published: 26 July 1993
PDF: 2 pages
Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19833G (26 July 1993); doi: 10.1117/12.2308543
Show Author Affiliations
R. Garcia Llamas, Univ. de Sonora (Mexico)


Published in SPIE Proceedings Vol. 1983:
16th Congress of the International Commission for Optics: Optics as a Key to High Technology
Gyorgy Akos; Tivadar Lippenyi; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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