Share Email Print
cover

Proceedings Paper

New attenuated total reflection method for refractive index measurement of enhanced accuracy
Author(s): Emöke Lörincz
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A novel reflection technique for refractive index determination of an optical layer (or multilayer) on a lower refraction index substrate is presented here. In the presence of absorption in at least one of the layers the observed characteristic minima enable high precision determination of the layer indices. The method is demonstrated on different polymer multi-layers. Accuracy limiting factors, such as surface roughness and thickness variation are also discussed.

Paper Details

Date Published: 26 July 1993
PDF: 2 pages
Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198338 (26 July 1993); doi: 10.1117/12.2308535
Show Author Affiliations
Emöke Lörincz, Technical Univ. Budapest (Hungary)


Published in SPIE Proceedings Vol. 1983:
16th Congress of the International Commission for Optics: Optics as a Key to High Technology
Gyorgy Akos; Tivadar Lippenyi; Gabor Lupkovics; Andras Podmaniczky, Editor(s)

© SPIE. Terms of Use
Back to Top