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Proceedings Paper • Open Access

Space optics with silicon wafers and slumped glass
Author(s): R. Hudec; V. Semencova; A. Inneman; M. Skulinova; L. Sveda; M. Míka; J. Sik; M. Lorenc

Paper Abstract

The future space X-ray astronomy imaging missions require very large collecting areas at still fine angular resolution and reasonable weight. The novel substrates for X-ray mirrors such as Silicon wafers and thin thermally formed glass enable wide applications of precise and very light weight (volume densities 2.3 to 2.5 gcm-3) optics. The recent status of novel technologies as well as developed test samples with emphasis on precise optical surfaces based on novel materials and their space applications is presented and discussed.

Paper Details

Date Published: 21 November 2017
PDF: 8 pages
Proc. SPIE 10566, International Conference on Space Optics — ICSO 2008, 105660Q (21 November 2017); doi: 10.1117/12.2308249
Show Author Affiliations
R. Hudec, Astronomical Institute (Czech Republic)
Rigaku Innovative Technologies Europe (Czech Republic)
V. Semencova, Rigaku Innovative Technologies Europe (Czech Republic)
Institute of Chemical Technology (Czech Republic)
A. Inneman, Rigaku Innovative Technologies Europe (Czech Republic)
M. Skulinova, Academy of Sciences of the Czech Republic (Czech Republic)
L. Sveda, Czech Technical Univ. (Czech Republic)
M. Míka, Institute of Chemical Technology (Czech Republic)
J. Sik, ON Semiconductor (Czech Republic)
M. Lorenc, ON Semiconductor (Czech Republic)


Published in SPIE Proceedings Vol. 10566:
International Conference on Space Optics — ICSO 2008
Josiane Costeraste; Errico Armandillo; Nikos Karafolas, Editor(s)

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