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Proceedings Paper • Open Access

Characterization and cleaning control of optical coatings by using a goniometric light scatter instrument with sample imaging ability

Paper Abstract

The principle of a new scattering measurement system including a mobile lighting and a fixed CCD array is described. This new system allows a spatially resolved light scattering characterization. Moreover it is possible to separate localized defects contribution from the local roughness measurement. The comprehensive characterization of optical coatings can be performed with this set-up, and some examples will be given.

Paper Details

Date Published: 21 November 2017
PDF: 8 pages
Proc. SPIE 10566, International Conference on Space Optics — ICSO 2008, 105662L (21 November 2017); doi: 10.1117/12.2308188
Show Author Affiliations
Myriam Zerrad, Institut Fresnel (France)
Michel Lequime, Institut Fresnel (France)
Carole Deumié, Institut Fresnel (France)
Claude Amra, Institut Fresnel (France)


Published in SPIE Proceedings Vol. 10566:
International Conference on Space Optics — ICSO 2008
Josiane Costeraste; Errico Armandillo; Nikos Karafolas, Editor(s)

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