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Proceedings Paper • Open Access

Absolute metrology for space interferometers
Author(s): Yves Salvadé; Alain Courteville; René Dändliker

Paper Abstract

The crucial issue of space-based interferometers is the laser interferometric metrology systems to monitor with very high accuracy optical path differences. Although classical high-resolution laser interferometers using a single wavelength are well developed, this type of incremental interferometer has a severe drawback: any interruption of the interferometer signal results in the loss of the zero reference, which requires a new calibration, starting at zero optical path difference. We propose in this paper an absolute metrology system based on multiplewavelength interferometry.

Paper Details

Date Published: 21 November 2017
PDF: 7 pages
Proc. SPIE 10569, International Conference on Space Optics — ICSO 2000, 1056905 (21 November 2017); doi: 10.1117/12.2307951
Show Author Affiliations
Yves Salvadé, Univ. de Neuchâtel (Switzerland)
Alain Courteville, Univ. de Neuchâtel (Switzerland)
René Dändliker, Univ. de Neuchâtel (Switzerland)


Published in SPIE Proceedings Vol. 10569:
International Conference on Space Optics — ICSO 2000
Georges Otrio, Editor(s)

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