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Proceedings Paper • Open Access

Thin film optical coatings for the ultraviolet spectral region
Author(s): P. Torchio; G. Albrand; M. Alvisi; C. Amra; H. Rauf; B. Cousin; G. Otrio

Paper Abstract

The applications and innovations related to the ultraviolet field are today in strong growth. To satisfy these developments which go from biomedical to the large equipment like the Storage Ring Free Electron Laser, it is crucial to control with an extreme precision the optical performances, in using the substrates and the thin film materials impossible to circumvent in this spectral range. In particular, the reduction of the losses by electromagnetic diffusion, Joule effect absorption, or the behavior under UV luminous flows of power, resistance to surrounding particulate flows... become top priority which concerns a broad European and international community.

Our laboratory has the theoretical, experimental and technological tools to design and fabricate numerous multilayer coatings with desirable optical properties in the visible and infrared spectral ranges. We have extended our expertise to the ultraviolet. We present here some results on high reflectivity multidielectric mirrors towards 250 nm in wavelength, produced by Ion Plating Deposition. The latter technique allows us to obtain surface treatments with low absorption and high resistance.

We give in this study the UV transparent materials and the manufacturing technology which have been the best suited to meet requirements.

Single UV layers were deposited and characterized. HfO2/SiO2 mirrors with a reflectance higher than 99% at 300 nm were obtained. Optical and non-optical characterizations such as UV spectrophotometric measurements, X-Ray Diffraction spectra, Scanning Electron Microscope and Atomic Force Microscope images were performed

Paper Details

Date Published: 21 November 2017
PDF: 13 pages
Proc. SPIE 10569, International Conference on Space Optics — ICSO 2000, 105691G (21 November 2017); doi: 10.1117/12.2307930
Show Author Affiliations
P. Torchio, Institut Fresnel (France)
G. Albrand, Institut Fresnel (France)
M. Alvisi, Institut Fresnel (France)
C. Amra, Institut Fresnel (France)
H. Rauf, Institut Fresnel (France)
B. Cousin, Ctr. National d'Études Spatiales (France)
G. Otrio, Ctr. National d'Études Spatiales (France)

Published in SPIE Proceedings Vol. 10569:
International Conference on Space Optics — ICSO 2000
Georges Otrio, Editor(s)

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