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Proceedings Paper • Open Access

Progress towards picometer accuracy laser metrology for the space interferometry mission
Author(s): Peter G. Halverson; Andreas Kuhnert; Jennifer Logan; Martin Regehr; Stuart Shaklan; Robert Spero; Feng Zhao; Tallis Chang; Edouard Schmidtlin; Roman Gutierrez; Thomas VanZandt; Jeffrey Yu

Paper Abstract

The Space Interferometry Mission, scheduled for launch in 2008, is an optical stellar interferometer with a 10 meter baseline capable of micro-arcsecond accuracy astrometry. A mission-enabling technology development program is underway at JPL, including the design and test of heterodyne interferometer metrology gauges to monitor the separation of optical components of the stellar interferometer. The gauges are required to have a resolution of 15 picometers and to track the motion of mirrors over several meters. We report laboratory progress in meeting these goals.

Paper Details

Date Published: 21 November 2017
PDF: 11 pages
Proc. SPIE 10569, International Conference on Space Optics — ICSO 2000, 1056919 (21 November 2017); doi: 10.1117/12.2307867
Show Author Affiliations
Peter G. Halverson, California Institute of Technology (United States)
Andreas Kuhnert, California Institute of Technology (United States)
Jennifer Logan, California Institute of Technology (United States)
Martin Regehr, California Institute of Technology (United States)
Stuart Shaklan, California Institute of Technology (United States)
Robert Spero, California Institute of Technology (United States)
Feng Zhao, California Institute of Technology (United States)
Tallis Chang, Chromux Technologies, Inc. (United States)
Edouard Schmidtlin, Siwave Inc. (United States)
Roman Gutierrez, Siwave Inc. (United States)
Thomas VanZandt, GEOSense (United States)
Jeffrey Yu, Holoplex Technologies Inc. (United States)


Published in SPIE Proceedings Vol. 10569:
International Conference on Space Optics — ICSO 2000
Georges Otrio, Editor(s)

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