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Proceedings Paper

Correlation plenoptic imaging with entangled photons
Author(s): Francesco Di Lena; Francesco V. Pepe; Alessio Avella; Ivano Ruo-Berchera; Giuliano Scarcelli; Augusto Garuccio; Milena D'Angelo
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Paper Abstract

Plenoptic imaging (PI) is an optical technique to perform three-dimensional imaging in a single shot. It is enabled by the simultaneous measurement of both the location and the propagation direction of light in a given scene. Despite being very useful for extending the depth of field, such technique entails a strong trade- off between spatial and angular resolution. This makes the resolution and the maximum achievable depth of focus inversely proportional; hence, resolution cannot be diffraction-limited. We have recently proposed a new procedure, called Correlation Plenoptic Imaging (CPI), to overcome such fundamental limits by collecting plenoptic information through intensity correlation measurement. Using two correlated beams, from either a chaotic or an entangled photon source, we perform imaging in one arm and simultaneously obtain the angular information in the other arm. In this paper, we discuss the case in which the two correlated beams of light are generated by spontaneous parametric down-conversion. We review the principles of CPI with entangled photons and discuss its resolution and depth-of-field limits.

Paper Details

Date Published: 21 May 2018
PDF: 6 pages
Proc. SPIE 10674, Quantum Technologies 2018, 106740H (21 May 2018); doi: 10.1117/12.2307836
Show Author Affiliations
Francesco Di Lena, Univ. degli Studi di Bari (Italy)
INFN (Italy)
Francesco V. Pepe, INFN (Italy)
Alessio Avella, Istituto Nazionale di Ricerca Metrologica (Italy)
Ivano Ruo-Berchera, Istituto Nazionale di Ricerca Metrologica (Italy)
Giuliano Scarcelli, Univ. of Maryland, College Park (United States)
Augusto Garuccio, Univ. degli Studi di Bari (Italy)
INFN (Italy)
INO-CNR (Italy)
Milena D'Angelo, Univ. degli Studi di Bari (Italy)
INFN (Italy)
INO-CNR (Italy)


Published in SPIE Proceedings Vol. 10674:
Quantum Technologies 2018
Jürgen Stuhler; Andrew J. Shields; Miles J. Padgett, Editor(s)

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