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Damage threshold studies on optical fibers and end-capped fibers with random antireflection (RAR) nanostructures
Author(s): Devinder Saini; Ron Mehl
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Paper Abstract

In this paper we describe the results of laser damage threshold studies conducted on silica fibers with etched random anti-reflection surfaces on their end faces. This study includes damage threshold of Motheyed surfaces on witness sample and fibers. Initial work has shown very promising results with damage thresholds greater than 46J/cm2 at 755nm on fibers.

Paper Details

Date Published: 9 May 2018
PDF: 5 pages
Proc. SPIE 10681, Micro-Structured and Specialty Optical Fibres V, 106810C (9 May 2018); doi: 10.1117/12.2307730
Show Author Affiliations
Devinder Saini, Fiberguide Industries, Inc. (United States)
Ron Mehl, Fiberguide Industries, Inc. (United States)

Published in SPIE Proceedings Vol. 10681:
Micro-Structured and Specialty Optical Fibres V
Kyriacos Kalli; Alexis Mendez; Christian-Alexander Bunge, Editor(s)

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