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Proceedings Paper

Using IR thermography for quantifying failure rates of electric power network components
Author(s): Angel Madrid
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Paper Abstract

A technique based on IR Thermography measurements is proposed to estimate realistic values of electric hardware failure rates corresponding to secondary failures, that is, those caused by past or present out-of-tolerance or abnormal operating conditions. The technique allows the establishment of useful correlations between these failure rates, and the corresponding relevant thermal patterns as mapped using JR Thermography. The technique is applied to practical cases of secondary failures in typical AC and DC electric power network components having to do with failure modes due to abnormal stress, corrosion, and erosion. The application of this technique to fault and failure diagnosis, and both Reliability, Availability, and Maintainability (RAM) Analysis and Probabilistic Risk Assessment (PRA) of electric power networks is also briefly discussed.

Paper Details

Date Published: 1 November 1990
PDF: 22 pages
Proc. SPIE 1341, Infrared Technology XVI, (1 November 1990); doi: 10.1117/12.23077
Show Author Affiliations
Angel Madrid, Engineering Consultant (Spain)

Published in SPIE Proceedings Vol. 1341:
Infrared Technology XVI
Irving J. Spiro, Editor(s)

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