Share Email Print
cover

Proceedings Paper • new

Time-of-flight absolute distance measurement with dual-comb
Author(s): Jibo Han; Tengfei Wu; Shuyi Li; Lei Zhang; Chunbo Zhao; Chuanqing Xia; Shuai Xing
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We demonstrate a time-of-flight absolute distance measurement method based second harmonic generation using dual-comb with different repetition rates. A distance of about 8m is measured, compared with a laser absolute tracer, the maximum deviation is 19μm at 100ms acquisition time.

Paper Details

Date Published: 20 February 2018
PDF: 4 pages
Proc. SPIE 10697, Fourth Seminar on Novel Optoelectronic Detection Technology and Application, 106972R (20 February 2018); doi: 10.1117/12.2307138
Show Author Affiliations
Jibo Han, Beijing Changcheng Institute of Metrology and Measurement (China)
Tengfei Wu, Beijing Changcheng Institute of Metrology and Measurement (China)
Shuyi Li, Beijing Changcheng Institute of Metrology and Measurement (China)
Lei Zhang, Beijing Changcheng Institute of Metrology and Measurement (China)
Chunbo Zhao, Beijing Changcheng Institute of Metrology and Measurement (China)
Chuanqing Xia, Beijing Changcheng Institute of Metrology and Measurement (China)
Shuai Xing, Beijing Changcheng Institute of Metrology and Measurement (China)


Published in SPIE Proceedings Vol. 10697:
Fourth Seminar on Novel Optoelectronic Detection Technology and Application
Weiqi Jin; Ye Li, Editor(s)

© SPIE. Terms of Use
Back to Top