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Proceedings Paper

Correlations between reflected and transmitted intensity patterns during coherent multiple scattering (Conference Presentation)
Author(s): Illia Starshynov; Alba M. Paniagua-Diaz; Nikos Fayard; Arthur Goetschy; Romain Pierrat; Rémi Carminati; Jacopo Bertolotti
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Paper Abstract

When light passes through a disordered medium, its wavefront is scrambled, resulting in a seemingly random speckle pattern. In the multiple scattering regime, it is commonly assumed that this randomization removes any memory about the original wavefront, effectively destroying all its information content. But as linear elastic scattering is a purely deterministic process, information is not destroyed, but just hidden and redistributed within these patterns. We present an experimental observation of the correlations between reflected and transmitted speckle patterns, which indicate that information can survive even very strong scattering. We show that there are two distinct contributions to the correlation function - a narrow positive peak and a broad negative dip, which depend in a different way on the system parameters. We study the dependence of this correlation on the thickness of the scattering medium and the mean free path of the light in the sample, probing different regimes from ballistic to diffusive scattering. We propose an experimental procedure, based on the ghost imaging technique, that allows to use this correlation for imaging of the objects hidden behind the scattering media.

Paper Details

Date Published: 24 May 2018
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Proc. SPIE 10677, Unconventional Optical Imaging, 1067714 (24 May 2018); doi: 10.1117/12.2306950
Show Author Affiliations
Illia Starshynov, Univ. of Exeter (United Kingdom)
Alba M. Paniagua-Diaz, Univ. of Exeter (United Kingdom)
Nikos Fayard, Institut Langevin, Ecole Supérieure de Physique et de Chimie Industrielles de la Ville de Paris (France)
Ctr. National de la Recherche Scientifique (France)
PSL Research Univ. Paris (France)
Arthur Goetschy, Institut Langevin, Ecole Supérieure de Physique et de Chimie Industrielles de la Ville de Paris (France)
Ctr. National de la Recherche Scientifique (France)
PSL Research Univ. (France)
Romain Pierrat, Institut Langevin, ESPCI ParisTech (France)
Ctr. National de la Recherche Scientifique (France)
PSL Research Univ. (France)
Rémi Carminati, Institut Langevin, ESPCI ParisTech (France)
Ctr. National de la Recherche Scientifique (France)
PSL Research Univ. (France)
Jacopo Bertolotti, Univ. of Exeter (United Kingdom)


Published in SPIE Proceedings Vol. 10677:
Unconventional Optical Imaging
Corinne Fournier; Marc P. Georges; Gabriel Popescu, Editor(s)

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