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Modeling and parameter retrieving in time domain spectroscopy of material and metamaterial
Author(s): Romain Peretti; Martin Micica; Sergey Mitryukovskiy; Kevin Froberger; Sophie Eliet; Mathias Vanwolleghem; Jean-François Lampin
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Paper Abstract

In this proceeding, we present a software Fit@TDS that enables to retrieve the refractive index of a sample from a timedomain spectroscopy experiment. The software include commonly used methods where the refractive index is extracted from frequency domain data. This method has limitations when the signal is too noisy or when the absorption peak saturates the absorption. Thus, the software includes as well a new method where the refractive index are directly fitted using a model (the Drude-Lorentz for example) in the time domain. This method uses an optimization algorithm that retrieves the parameters of the model corresponding to the studied material. In this proceeding, we explain the methods and test them on fictitious samples to probe the feasibility and reliability of the proposed model.

Paper Details

Date Published: 14 May 2018
PDF: 9 pages
Proc. SPIE 10684, Nonlinear Optics and its Applications 2018, 106840P (14 May 2018); doi: 10.1117/12.2306932
Show Author Affiliations
Romain Peretti, Institut d'Electronique de Microélectronique et de Nanotechnologie (France)
Martin Micica, Institut d'Electronique de Microélectronique et de Nanotechnologie (France)
VŠB-Technical Univ. of Ostrava (Czech Republic)
Sergey Mitryukovskiy, Institut d'Electronique de Microélectronique et de Nanotechnologie (France)
Kevin Froberger, Institut d'Electronique de Microélectronique et de Nanotechnologie (France)
Sophie Eliet, Institut d'Electronique de Microélectronique et de Nanotechnologie (France)
Mathias Vanwolleghem, Institut d'Electronique de Microélectronique et de Nanotechnologie (France)
Jean-François Lampin, Institut d'Electronique de Microélectronique et de Nanotechnologie (France)


Published in SPIE Proceedings Vol. 10684:
Nonlinear Optics and its Applications 2018
Benjamin J. Eggleton; Neil G. R. Broderick; Anna C. Peacock, Editor(s)

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