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Two-step phase shifting in fringe projection: modeling and analysis
Author(s): Jiaqi Mao; Yongkai Yin; Xiangfeng Meng; Xiulun Yang; Lei Lu; Dechun Li; Christian Pape; Eduard Reithmeier
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Paper Abstract

This work proposes a two-step phase-shifting algorithm as an improvement of fringe projection profilometry. Considering the working process of fringe projection, the captured fringe image is formulated with two variables, i.e. surface reflectivity and phase value. And a phase shift of 3π/2 is introduced to get the two-step phase-shifting. After appropriate variable substitution, expressions of two fringe images can be transformed into two equations corresponding to a line and a circle respectively. With this circle-line model, the characteristic of solution and the phase error due to non-zero ambient light are analyzed. Then the approach of error compensation is proposed based on estimation of the real fringe contrast and non-linear least square optimization. The validity of the proposed approach is demonstrated with both simulations and experiments.

Paper Details

Date Published: 24 May 2018
PDF: 10 pages
Proc. SPIE 10678, Optical Micro- and Nanometrology VII, 106780V (24 May 2018); doi: 10.1117/12.2306641
Show Author Affiliations
Jiaqi Mao, Shandong Univ. (China)
Yongkai Yin, Shandong Univ. (China)
Leibniz Univ. Hannover (Germany)
Xiangfeng Meng, Shandong Univ. (China)
Xiulun Yang, Shandong Univ. (China)
Lei Lu, Henan Univ. of Technology (China)
Dechun Li, Shandong Univ. (China)
Christian Pape, Leibniz Univ. Hannover (Germany)
Eduard Reithmeier, Leibniz Univ. Hannover (Germany)


Published in SPIE Proceedings Vol. 10678:
Optical Micro- and Nanometrology VII
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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