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Thin film partial reflectors for generating contrast in millimeter wave images
Author(s): Jeffrey Barber; Peter R. Smith; Lindsey Gray; Angel Yam; Joseph Greca; Kevin Yam; James C. Weatherall; Duane Karns; Barry T. Smith
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Paper Abstract

Depth resolution and contrast (grayscale) resolution test objects have been proposed for incorporation into an ANSI standard for image quality of active millimeter wave (MMW) imagers for screening humans. A design for a depth resolution target has required the need for a thin film to generate a reflection while allowing for metal targets behind it to be visible to MMW imagers. Materials to accomplish this task have been identified, essentially acting as a millimeter wave beam splitter. Images obtained with a wide-bandwidth MMW imaging system are discussed. Additionally, by altering the resistivity of the thin film, the reflection coefficient of the film changes, allowing these films to be used as a contrast phantom for the testing of millimeter wave imaging systems. Measurements using laboratory millimeter wave systems are in good agreement with theory, and an image collected with a commercially-available MMW imaging systems is presented.

Paper Details

Date Published: 11 May 2018
PDF: 10 pages
Proc. SPIE 10634, Passive and Active Millimeter-Wave Imaging XXI, 106340I (11 May 2018); doi: 10.1117/12.2306335
Show Author Affiliations
Jeffrey Barber, U.S. Dept. of Homeland Security (United States)
Peter R. Smith, AASKI Technology, Inc. (United States)
Lindsey Gray, Ramapo College of New Jersey (United States)
Angel Yam, Univ. at Buffalo (United States)
Joseph Greca, Battelle Memorial Institute (United States)
Kevin Yam, Battelle Memorial Institute (United States)
James C. Weatherall, Battelle Memorial Institute (United States)
Duane Karns, Aerotek, Inc. (United States)
Barry T. Smith, U.S. Dept. of Homeland Security (United States)

Published in SPIE Proceedings Vol. 10634:
Passive and Active Millimeter-Wave Imaging XXI
David A. Wikner; Duncan A. Robertson, Editor(s)

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