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On the relationships between higher and lower bit-depth system measurements
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Paper Abstract

The quality of an imaging system can be assessed through controlled laboratory objective measurements. Currently, all imaging measurements require some form of digitization in order to evaluate a metric. Depending on the device, the amount of bits available, relative to a fixed dynamic range, will exhibit quantization artifacts. From a measurement standpoint, measurements are desired to be performed at the highest possible bit-depth available. In this correspondence, we described the relationship between higher and lower bit-depth measurements. The limits to which quantization alters the observed measurements will be presented. Specifically, we address dynamic range, MTF, SiTF, and noise. Our results provide guidelines to how systems of lower bit-depth should be characterized and the corresponding experimental methods.

Paper Details

Date Published: 26 April 2018
PDF: 8 pages
Proc. SPIE 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX, 106250A (26 April 2018); doi: 10.1117/12.2305423
Show Author Affiliations
Stephen D. Burks, U.S. Army RDECOM CERDEC NVESD (United States)
David P. Haefner, U.S. Army RDECOM CERDEC NVESD (United States)
Joshua M. Doe, U.S. Army RDECOM CERDEC NVESD (United States)


Published in SPIE Proceedings Vol. 10625:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
Gerald C. Holst; Keith A. Krapels, Editor(s)

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