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Proceedings Paper

Optical constants and polarimetric properties of AlN thin films
Author(s): Yu. A. Ushenko; P. D. Maryanchuk; M. M. Solovan; L. J. Pidkamin; V. V. Brus
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Paper Abstract

The results of an experimental study of the polarization characteristics of thin films based on aluminum nitride (AlN) are presented. It was found that an increase in the partial pressure of nitrogen (with the appropriate technology for producing the AlN film) leads to a substantial increase in the absorptivity of the film itself and a decrease in its linear dichroism parameter.

Paper Details

Date Published: 18 January 2018
PDF: 7 pages
Proc. SPIE 10612, Thirteenth International Conference on Correlation Optics, 106121A (18 January 2018); doi: 10.1117/12.2305365
Show Author Affiliations
Yu. A. Ushenko, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
P. D. Maryanchuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
M. M. Solovan, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
L. J. Pidkamin, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
V. V. Brus, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 10612:
Thirteenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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