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Defect detection in foams and encapsulants using grating-based x-ray phase contrast imaging (Rising Researcher Presentation) (Conference Presentation)
Author(s): Amber L. Dagel; Christian L. Arrington; Patrick S. Finnegan; Ryan N. Goodner; Andrew E. Hollowell
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Paper Abstract

Foams and encapsulants serve important roles in the protection of the components they surround. These low density materials may be used to provide shock protection, to protect against high voltage breakdown, or to minimize thermal fluctuations. Voids and gaps in the material, delaminations from a mating material, or non-uniformities in the encapsulating materials can lead to critical failures in the encapsulated component. Despite the important role these low density materials serve, traditional non-destructive inspection tools are limited in their ability to study this material set, especially in the presence of high density materials such as wires. The default approach has been destructive post-mortums where components are deconstructed after a failure and cause and effect are difficult to distinguish. X-ray phase contrast imaging has a longer history at synchrotrons, but this is not a realistic solution for non-destructive inspection. We have demonstrated grating-based x-ray phase contrast 3-D tomography in a laboratory environment with a conventional x-ray tube. Our large format grating fabrication capability enables imaging with large fields of view (10 cm2) at 28 keV for the successful non-destructive inspection of these low-density materials. We demonstrate that the complementary image modalities available with XPCI provide unique information and higher contrast for the inspection of defects in low density materials than conventional x-ray alone.

Paper Details

Date Published: 14 May 2018
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Proc. SPIE 10632, Anomaly Detection and Imaging with X-Rays (ADIX) III, 106320M (14 May 2018); doi: 10.1117/12.2305250
Show Author Affiliations
Amber L. Dagel, Sandia National Labs. (United States)
Christian L. Arrington, Sandia National Labs. (United States)
Patrick S. Finnegan, Sandia National Labs. (United States)
Ryan N. Goodner, Sandia National Labs. (United States)
Andrew E. Hollowell, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 10632:
Anomaly Detection and Imaging with X-Rays (ADIX) III
Amit Ashok; Joel A. Greenberg; Michael E. Gehm; Mark A. Neifeld, Editor(s)

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