Share Email Print

Proceedings Paper

Advanced imaging capabilities by incorporating plasmonics and metamaterials in detectors
Author(s): John Hennessy; April D. Jewell; Michael E. Hoenk; David Hitlin; Mickel McClish; Alexander G. Carver; Todd J. Jones; Ahmed Morsy; Michelle Povinelli; L. Douglas Bell; Shouleh Nikzad
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Ultraviolet detection is often required to be made in the presence of a strong background of solar radiation which needs to be suppressed, but materials limitations at these wavelengths can impact both filter and sensor performance. In this work, we explore the use of 1D photonic bandgap structures integrated directly onto a Si sensor that can operate with solar blindness. These filters take advantage of the improved admittance with silicon to significantly improve throughput over conventional stand-alone bandpass filter elements. At far ultraviolet wavelengths these filters require the use of non-absorbing dielectrics such as the metal fluoride materials of MgF2, AlF3 and LiF. The latest performance of these 1D multilayer filters on Si photodiodes and CCD imaging sensors is demonstrated. We have also extended these 1D structures to more complex multilayers guided by the design concepts of metamaterials and metatronics, and to 2D patterned plasmonic hole array filters fabricated in aluminum. The performance of sensors and test filter structures is presented with an emphasis on UV throughput.

Paper Details

Date Published: 14 May 2018
PDF: 7 pages
Proc. SPIE 10639, Micro- and Nanotechnology Sensors, Systems, and Applications X, 106391P (14 May 2018); doi: 10.1117/12.2305126
Show Author Affiliations
John Hennessy, Jet Propulsion Lab. (United States)
April D. Jewell, Jet Propulsion Lab. (United States)
Michael E. Hoenk, Jet Propulsion Lab. (United States)
David Hitlin, California Institute of Technology (United States)
Mickel McClish, Radiation Monitoring Devices, Inc. (United States)
Alexander G. Carver, Jet Propulsion Lab. (United States)
Todd J. Jones, Jet Propulsion Lab. (United States)
Ahmed Morsy, Univ. of Southern California (United States)
Michelle Povinelli, Univ. of Southern California (United States)
L. Douglas Bell, Jet Propulsion Lab. (United States)
Shouleh Nikzad, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 10639:
Micro- and Nanotechnology Sensors, Systems, and Applications X
Thomas George; Achyut K. Dutta; M. Saif Islam, Editor(s)

© SPIE. Terms of Use
Back to Top