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Proceedings Paper

Thermal conductivity of chalcogenide glasses measured by Raman spectroscopy
Author(s): Anupama Yadav; Derek M. Kita; Peter Su; Antoine Lepicard; Anuradha Murthy Agarwal; Juejun Hu; Marc Dussauze; Kathleen Richardson
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Paper Abstract

We review the potential and limitations of a temperature-dependent Raman Scattering Technique (RST) as a nondestructive optical tool to investigate the thermal properties of bulk Chalcogenide Glasses (ChGs). Conventional thermal conductivity measurement techniques employed for bulk materials cannot be readily extended to thin films created from the parent bulk. This work summarizes the state of the art, and discusses the possibility to measure more accurately the thermal conductivity of bulk ChGs with micrometer resolution using RST. Using this information, we aim to extend the method to measure the thermal conductivity on thin films. While RST has been employed to evaluate the thermal conductivity data of 2D materials such as graphene, molybdenum disulfide, carbon nanotubes and silicon, it has not been used to effectively duplicate data on ChGs which have been measured by traditional measurement tools. The present work identifies and summarizes the limitations of using RST to measure the thermal conductivity on ChGs. In this technique, the temperature of a laser spot was monitored using Raman Scattering Spectra, and efforts were made to measure the thermal conductivity of bulk AMTIR 1 (Ge33As12Se55) and Ge32.5As10Se57.5 ChGs by analyzing heat diffusion equations. To validate the approach, another conventional technique - Transient Plane Source (TPS) has been used for assessing the thermal conductivity of these bulk glasses. Extension to other more complicated materials (glass ceramics) where signatures from both the glassy matrix and crystallites, are discussed.

Paper Details

Date Published: 8 May 2018
PDF: 9 pages
Proc. SPIE 10627, Advanced Optics for Defense Applications: UV through LWIR III, 106270P (8 May 2018); doi: 10.1117/12.2305089
Show Author Affiliations
Anupama Yadav, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Derek M. Kita, Massachusetts Institute of Technology (United States)
Peter Su, Massachusetts Institute of Technology (United States)
Antoine Lepicard, Institut des Sciences Moléculaires, Univ. de Bordeaux, CNRS (France)
Anuradha Murthy Agarwal, Massachusetts Institute of Technology (United States)
Juejun Hu, Massachusetts Institute of Technology (United States)
Marc Dussauze, Institut des Sciences Moléculaires, Univ. de Bordeaux, CNRS (France)
Kathleen Richardson, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 10627:
Advanced Optics for Defense Applications: UV through LWIR III
Jay N. Vizgaitis; Bjørn F. Andresen; Peter L. Marasco; Jasbinder S. Sanghera; Miguel P. Snyder, Editor(s)

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