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Surface plasmon polariton mode validation using commercially available finite element method ANSYS HFSS
Author(s): Michael F. Finch; Olanrewaju P. Olaogun; Brian A. Lail
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Paper Abstract

Numerical computation using HFSS finite element analysis was conducted in order to determine the dispersion relation (complex index) of the surface plasmon polariton (SPP) mode. SPP result from the interaction or coupling between electromagnetic fields in the form of light and delocalised electrons on a metal interface. SPPs has the effect of confining electromagnetic radiation on the order that is smaller than the wavelength. In this work, the correspondence by H.P Hsu (IEEE Trans. Microw. Theory Techn., 11(4), (1963).) was used in the study of SPP modes comparing both analytical calculations and numerical calculation from ANSYS HFSS to ascertain the veracity of the correspondence for SPP surface waves, and calculating the attenuation coefficient using quality factor, Q, obtained from HFSS eigenmode calculations. Silicon dioxide and silver with the use of measured complex permittivity for silver is used to conduct this study. Numerically-obtained results for propagation length and SPP effective index are compared to analytical calculations from the well-known SPP dispersion relationship.

Paper Details

Date Published: 14 May 2018
PDF: 6 pages
Proc. SPIE 10656, Image Sensing Technologies: Materials, Devices, Systems, and Applications V, 106561O (14 May 2018); doi: 10.1117/12.2304424
Show Author Affiliations
Michael F. Finch, Florida Institute of Technology (United States)
Olanrewaju P. Olaogun, Florida Institute of Technology (United States)
Brian A. Lail, Florida Institute of Technology (United States)


Published in SPIE Proceedings Vol. 10656:
Image Sensing Technologies: Materials, Devices, Systems, and Applications V
Nibir K. Dhar; Achyut K. Dutta, Editor(s)

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