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100W-level peak power laser system tunable in the LWIR applied to detection of persistent chemical agents
Author(s): F. Gutty; A. Grisard; C. Larat; D. Papillon; M. Schwarz; E. Lallier; H. D. Tholl; F. Münzhuber; J. Kunz; M. Raab; M. Rattunde; Stefan Hugger; Mariusz Kastek; Tadeusz Piatkowski; François Brygo; Cédric Awanzino; Frank Wilsenack
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Paper Abstract

Through the European Defence Agency, the Joint Investment Programme on CBRN protection funded the project AMURFOCAL to address detection at stand-off distances with amplified quantum cascade laser technology in the longwave infrared spectral range, where chemical agents have specific absorptions features.

An instrument was developed based on infrared backscattering spectroscopy. We realized a pulsed laser system with a fast tunability from 8 to 10 μm using an external-cavity quantum cascade laser (EC-QCL) and optical parametric amplification (OPA). The EC-QCL is tunable from 8 to 10 μm and delivers output peak powers up to 500 mW. The peak power is amplified with high gain in an orientation-patterned gallium arsenide (OP-GaAs) nonlinear crystal. We developed a pulsed fiber laser acousto-optically tunable from 1880 to 1980 nm with output peak powers up to 7 kW as pump source to realize an efficient quasi-phase matched OPA without any mechanical or thermal action onto the nonlinear crystal. Mixing the EC-QCL and the pump beams within the OP-GaAs crystal and tuning the pump wavelength enables parametric amplification of the EC-QCL from 8 to 10 μm leading to up to 120 W peak power. The output is transmitted to a target at a distance of 10 – 20 m. A receiver based on a broadband infrared detector comprises a few detector elements. A 3D data cube is registered by wavelength tuning the laser emission while recording a synchronized signal received from the target. The presentation will describe the AMURFOCAL instrument, its functional units and its principles of operation.

Paper Details

Date Published: 14 May 2018
PDF: 12 pages
Proc. SPIE 10639, Micro- and Nanotechnology Sensors, Systems, and Applications X, 106392E (14 May 2018); doi: 10.1117/12.2304378
Show Author Affiliations
F. Gutty, Thales Research & Technology (France)
A. Grisard, Thales Research & Technology (France)
C. Larat, Thales Research & Technology (France)
D. Papillon, Thales Research & Technology (France)
M. Schwarz, Thales Research & Technology (France)
E. Lallier, Thales Research & Technology (France)
H. D. Tholl, Diehl Defence GmbH & Co. KG (Germany)
F. Münzhuber, Diehl Defence GmbH & Co. KG (Germany)
J. Kunz, Diehl Defence GmbH & Co. KG (Germany)
M. Raab, Diehl Defence GmbH & Co. KG (Germany)
M. Rattunde, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
Stefan Hugger, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
Mariusz Kastek, Military Univ. of Technology (Poland)
Tadeusz Piatkowski, Military Univ. of Technology (Poland)
François Brygo, Bertin Technologies (France)
Cédric Awanzino, Bertin Technologies (France)
Frank Wilsenack, Wehrwissenschaftliches Institut für Schutztechnologien (Germany)


Published in SPIE Proceedings Vol. 10639:
Micro- and Nanotechnology Sensors, Systems, and Applications X
Thomas George; Achyut K. Dutta; M. Saif Islam, Editor(s)

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