Share Email Print
cover

Proceedings Paper

Measurement of creep strain in polymers by means of electronic speckle pattern shearing interferometry
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this work, authors present a new application of electronic speckle pattern shearing interferometry (shearography) to a phenomenon known as creep compliance, which is an important mechanical property of viscoelastic materials. Two different sealing elastomers were tested in a short-term creep experiment, applying a constant tensile stress to a specimen. An experimental in-plane shearography setup was implemented to measure the in-plane creep strains produced in the tested object. In order to show the effectiveness of shearography for the assessment of this viscoelastic mechanical property, results were compared to that obtained with an equipment of Digital Image Correlation (DIC). It was demonstrated that shearography can be potentially and successfully applied to the creep analysis of these kind of materials. Finally, advantages and limitations of this measurement method are discussed.

Paper Details

Date Published: 14 May 2018
PDF: 9 pages
Proc. SPIE 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII, 106670H (14 May 2018); doi: 10.1117/12.2303899
Show Author Affiliations
Juan Benito Pascual-Francisco, Instituto Politécnico Nacional (Mexico)
Orlando Susarrey-Huerta, Instituto Politécnico Nacional (Mexico)
Alexandre Michtchenko, Instituto Politécnico Nacional (Mexico)
Omar Barragán-Pérez, Instituto Politécnico Nacional (Mexico)


Published in SPIE Proceedings Vol. 10667:
Dimensional Optical Metrology and Inspection for Practical Applications VII
Kevin G. Harding; Song Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top