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Proceedings Paper

Holographic microinterferometric technique for measurements of laser diode cavity deformations
Author(s): Ludmila E. Batay; Andrei N. Kuzmin; Gennadii I. Ryabtsev
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Paper Abstract

Holographic interferometric technique for measurement of laser diode crystal thermoelastic deformations is presented. Using this technique allows us to estimate thermoelastic stresses in laser crystal, active layer temperature and dynamics of heat transfer from laser crystal to heatsink.

Paper Details

Date Published: 19 January 1996
PDF: 10 pages
Proc. SPIE 2599, Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology, (19 January 1996); doi: 10.1117/12.230383
Show Author Affiliations
Ludmila E. Batay, B.I. Stepanov Institute of Physics (Belarus)
Andrei N. Kuzmin, B.I. Stepanov Institute of Physics (Belarus)
Gennadii I. Ryabtsev, B.I. Stepanov Institute of Physics (Belarus)


Published in SPIE Proceedings Vol. 2599:
Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology
Michael R. Descour; Kevin G. Harding; Donald J. Svetkoff, Editor(s)

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