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Anomaly detection and target prioritization in planetary imagery via the automated global feature analyzer (AGFA): Progress towards a driver for autonomous C4ISR missions
Author(s): Wolfgang Fink; Alexander J.-W. Brooks; Mark A. Tarbell
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Paper Abstract

The Automated Global Feature AnalyzerTM (AGFATM) is a generically applicable automated sensor-data-fusion, feature extraction, feature vector clustering, anomaly detection, and target prioritization framework. AGFATM operates in the respective feature space delivered by the sensor(s). In this paper we provide an overview of the inner workings of AGFATM and apply AGFATM to planetary imagery, representative of past, current, and future planetary missions, to demonstrate its automated and objective (i.e., unbiased) anomaly detection and target prioritization (i.e., region-of-interest delineation) capabilities. Imaged operational areas are locally processed via a cascade of image segmentation, visual and geometric feature extraction, agglomerative clustering, and principal components analysis. Resulting clusters are labeled based on relative size and location in feature space. Anomalous regions may be considered immediate targets for follow-up in-situ investigation by local robotic agents, which can be directed via autonomous telecommanding, e.g., as part of a Tier-Scalable Reconnaissance mission architecture. These capabilities will be essential for driving fully autonomous C4ISR missions of the future, since the speed of light prohibits “real time” Earth-controlled conduct of planetary exploration beyond the Moon.

Paper Details

Date Published: 14 May 2018
PDF: 17 pages
Proc. SPIE 10639, Micro- and Nanotechnology Sensors, Systems, and Applications X, 106391Z (14 May 2018); doi: 10.1117/12.2303795
Show Author Affiliations
Wolfgang Fink, The Univ. of Arizona (United States)
Alexander J.-W. Brooks, The Univ. of Arizona (United States)
Mark A. Tarbell, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 10639:
Micro- and Nanotechnology Sensors, Systems, and Applications X
Thomas George; Achyut K. Dutta; M. Saif Islam, Editor(s)

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