Share Email Print
cover

Proceedings Paper

Three-dimensional imaging of engineering surfaces
Author(s): E. Mainsah; Weiping P. Dong; Kenneth J. Stout
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A comprehensive characterization of a surface can only be effected through a combination of visualization techniques and numerical descriptors -- no one technique suffices. In addition, for this analysis to bear a useful relation to function, the three-dimensional (3-D) nature of the surface must be taken into consideration. The latter consideration has meant that over the last decade, 3-D surface measurement techniques have become more prevalent and a large number of visualization techniques have emerged -- but there is as yet, no standard for measuring surfaces in 3-D. Recent work carried out by the University of Birmingham and Ecole Centrale de Lyon and sponsored by the Commission of the European Communities has sought to develop an integrated approach to three-dimensional micro-topography analysis. The long term objective of the work was the emergence of standardization in the area. The main aspect of this work relates to the definition of a clutch of fourteen parameters for surface topography analysis as a means of easing communication in the topography community as well as limiting the unnecessary proliferation of parameters whose functional implications are dubious. This paper sets out to describe the use of visualization techniques to assess 3-D surfaces as well as to present a detailed summary of the parameters developed at the University of Birmingham. These have now been incorporated into many commercial instruments and there is every likelihood that they will form the basis of a future international standard in 3-D topography.

Paper Details

Date Published: 19 January 1996
PDF: 14 pages
Proc. SPIE 2599, Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology, (19 January 1996); doi: 10.1117/12.230373
Show Author Affiliations
E. Mainsah, Coventry University (United Kingdom)
Weiping P. Dong, Univ. of Connecticut (United States)
Kenneth J. Stout, Univ. of Birmingham (United Kingdom)


Published in SPIE Proceedings Vol. 2599:
Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology
Michael R. Descour; Kevin G. Harding; Donald J. Svetkoff, Editor(s)

© SPIE. Terms of Use
Back to Top