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The role of texturing in x-ray diffraction tomography
Author(s): Joel A. Greenberg; Chris MacGibbon; Dean Hazineh; Brian Keohane; Scott Wolter
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Paper Abstract

Concealed threat detection is a challenging task that requires a high degree of material specificity. X-ray diffraction tomography (XRDT) offers a solution to the problem, but may at times be too sensitive to the details and history of a given sample. One example of this effect arises in the dependence of the measured scatter signal to the orientation of the sample relative to the beam, which we refer to generally as texturing. To better understand texturing in real world materials and imaging scenarios, we develop two experimental systems for measuring scatter and create databases of the resulting scatter form factors over a range of energies and angles. We then use this data to develop a simulation tool to model XRDT systems in the presence of textured materials and analyze the results. While texturing introduces complications to accurate imaging of an object, we find that choices in the measurement strategy can mitigate these effects and improve performance.

Paper Details

Date Published: 4 May 2018
PDF: 9 pages
Proc. SPIE 10632, Anomaly Detection and Imaging with X-Rays (ADIX) III, 106320B (4 May 2018); doi: 10.1117/12.2303620
Show Author Affiliations
Joel A. Greenberg, Duke Univ. (United States)
Chris MacGibbon, Duke Univ. (United States)
Dean Hazineh, Duke Univ. (United States)
Brian Keohane, Duke Univ. (United States)
Scott Wolter, Elon Univ. (United States)


Published in SPIE Proceedings Vol. 10632:
Anomaly Detection and Imaging with X-Rays (ADIX) III
Amit Ashok; Joel A. Greenberg; Michael E. Gehm; Mark A. Neifeld, Editor(s)

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