Share Email Print

Proceedings Paper

In situ polymerization threshold detection of 3-color systems and a study of the time dependence
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A three-color lithographic (3CL) scheme has been developed to achieve high resolution through the use of visible and near IR wavelengths. The intrinsic kinetic properties of 3CL materials are used to optimize the efficiency of deactivation, a crucial step in overcoming background buildup in multipatterning using this technique. To study materials of interest for 3CL, we have developed an in situ technique to monitor exposure and deactivation. A two-beam interference pattern is polymerized on a photoresist and the diffraction of a continuous-wave probe laser is measured in order to identify the polymerization and deactivation thresholds. Here we present preliminary results on the time dependence of the deactivation efficiency of 3CL materials and in situ detection of polymerization thresholds. This is a study of the kinetics for polymerization of 3CL materials to optimize the 3CL scheme to achieve the highest resolution and elucidate its mechanism.

Paper Details

Date Published: 19 March 2018
PDF: 6 pages
Proc. SPIE 10584, Novel Patterning Technologies 2018, 1058419 (19 March 2018); doi: 10.1117/12.2302807
Show Author Affiliations
Hannah M. Ogden, Univ. of Maryland, College Park (United States)
Amy S. Mullin, Univ. of Maryland, College Park (United States)
Sandra A. Gutierrez Razo, Univ. of Maryland, College Park (United States)
Nikolaos Liaros, Univ. of Maryland, College Park (United States)
John T. Fourkas, Univ. of Maryland, College Park (United States)
John Peterson, Univ. of Maryland, College Park (United States)
Periodic Structures, Inc. (United States)

Published in SPIE Proceedings Vol. 10584:
Novel Patterning Technologies 2018
Eric M. Panning, Editor(s)

© SPIE. Terms of Use
Back to Top