
Proceedings Paper
Production integration of automated SPC/SQC testing and inspection for rate production of Z-architecture focal planesFormat | Member Price | Non-Member Price |
---|---|---|
$14.40 | $18.00 |
![]() |
GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. | Check Access |
Paper Abstract
In a highly automated, high rate, "hands off" production system, in-process
inspections can no longer be isolated from the production processes, but must be commingled chronologically and physically within the manufacturing processes and their
applicable equipments. This must be accomplished, however, without losing the
autonomy and purposes of inspection in the classical sense. This paper will not only
show how inspections can be maintained in such an environment of automation, but how
processes, yields and sample inspection levels can be enhanced by real time and
near-term correlation of process and inspection variables.
Paper Details
Date Published: 1 November 1990
PDF: 9 pages
Proc. SPIE 1339, Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array Technology II, (1 November 1990); doi: 10.1117/12.23024
Published in SPIE Proceedings Vol. 1339:
Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array Technology II
John C. Carson, Editor(s)
PDF: 9 pages
Proc. SPIE 1339, Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array Technology II, (1 November 1990); doi: 10.1117/12.23024
Show Author Affiliations
Sandra H. Whitten, Grumman Aerospace Corp. (United States)
Frank D. De Meo, Grumman Aerospace Corp. (United States)
Published in SPIE Proceedings Vol. 1339:
Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array Technology II
John C. Carson, Editor(s)
© SPIE. Terms of Use
