Share Email Print

Proceedings Paper

A new technique for the measurement of thin film growth
Author(s): T. F. Morse
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

By depositing thin films on the end of an optical fiber, it is possible to make simple, in situ measurements of film growth, refractive index, and surface roughness. Agreement with witness samples is excellent.

Paper Details

Date Published: 1 September 1999
PDF: 4 pages
Proc. SPIE 3746, 13th International Conference on Optical Fiber Sensors, 374626 (1 September 1999); doi: 10.1117/12.2302068
Show Author Affiliations
T. F. Morse, Brown Univ. (United States)

Published in SPIE Proceedings Vol. 3746:
13th International Conference on Optical Fiber Sensors
Byoung Yoon Kim; Kazuo Hotate, Editor(s)

© SPIE. Terms of Use
Back to Top