Share Email Print

Proceedings Paper

Scattering parameter measurements using a three-probe microstrip circuit
Author(s): Ming-Yi Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A simple, low cost three - probe microstrip circuit has been developed for S - parameter measurements of a two - port network. The results agree very well with those from HP 8510 automatic network analyzer. The design and algorithm can be easily scaled to millimeterwave frequencies.

Paper Details

Date Published: 1 December 1990
PDF: 3 pages
Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 15146K (1 December 1990); doi: 10.1117/12.2301646
Show Author Affiliations
Ming-Yi Li, Texas A&M Univ. (United States)

Published in SPIE Proceedings Vol. 1514:
15th International Conference on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

© SPIE. Terms of Use
Back to Top